光伏科学家大会 (口头报告)

特邀演讲嘉宾

 
Thomas REINDL 博士,副所长, 新加坡太阳能研究所(SERIS),新加坡

 
演讲时间:  5月29日

Thomas REINDL is Deputy CEO of the Solar Energy Research Institute of Singapore (SERIS) and Principal Research Fellow at the National University of Singapore (NUS). He started with photovoltaics (PV) in 1992 at the SIEMENS Corporate R&D Labs. After holding several management positions at SIEMENS and running one of the leading German PV systems integration companies as Chief Operating Officer, he joined SERIS in 2010 and soon became Director of the Solar Energy System cluster. During his time at SERIS, he won public research grants in excess of SGD 20 million, founded 2 spin-off companies and authored strategic scientific papers such as the "PV Roadmap for Singapore". Dr. Reindl holds a Master in Chemistry, a Ph.D. in Natural Sciences and an MBA from INSEAD, all awarded with highest honors. His research interest are high-performance PV and embedded systems, techno-economic road-mapping and the reliable integration of renewable energies into power systems.
演讲摘要: Solar PV has seen an unprecedented growth over the past five years, with the global installed capacity having surpassed 400 GWp in 2017. However, like any other industrial technology, PV systems are also vulnerable to failures due to anomalies in PV modules, other system components or inadequate system design, leading to under-performance or even a complete breakdown. In addition, the need for cost competitiveness and rapid scaling of the deployment has caused a number of installation companies to compromise on quality, thereby providing sub-standard products and designs for the installation of the systems. In consequence, this will lead to poor financial returns, which negatively affects investors’ willingness to further finance the growth of the global solar deployment. The risk of under-performing PV systems is particularly high in fast-growing markets, for example China. This presentation shows the state-of-the-art in field testing of PV systems. Starting with a comprehensive monitoring of the system performance over time and assessment of individual failure events, it will describe in detail how to “read” string I-V curves and interpret visual and infrared inspections. In particular, the talk will elaborate on the use of luminescence imaging for fault analysis in PV systems. This includes photo- and electro-luminescence analysis during day-time, as well as fluorescence imaging. Typical failure modes are discussed and rectification measures (including their economic viability) are presented.